IMAGING OF A SUSPENDED HELIUM FILM WITH 2-D ELECTRONS BY INTERFEROMETRY

Citation
Amc. Valkering et al., IMAGING OF A SUSPENDED HELIUM FILM WITH 2-D ELECTRONS BY INTERFEROMETRY, Journal of low temperature physics, 113(5-6), 1998, pp. 1115-1120
Citations number
10
Categorie Soggetti
Physics, Applied
ISSN journal
00222291
Volume
113
Issue
5-6
Year of publication
1998
Pages
1115 - 1120
Database
ISI
SICI code
0022-2291(1998)113:5-6<1115:IOASHF>2.0.ZU;2-N
Abstract
A helium film suspended between elevations on a substrate forms an exc ellent surface for a two-dimensional electron gas. With the structure on the substrate a quasi one-dimensional electron system can be create d. Experiments probing the electrical transport properties of this sys tem have raised questions about the suspended helium film itself. We r eport measurements of the suspended film using interferometry. The pro file is mapped out as a function of the bull helium level beneath the substrate. By measuring the electron signal simultaneously the relatio n between the signal and the film profile can be obtained.