FIELD ENHANCEMENT IN LASER-ASSISTED SCANNING TUNNELING MICROSCOPE

The coupling of laser radiation into the Scanning Probe Microscope jun ction offers a powerful tool to investigate optical and;spectroscopic properties of diverse surfaces with high spatial resolution. The study of strong laser field enhancement at the junction produced by the pro ximity between the tip and the sample in a laser assisted Scanning Tun neling Microscope (STM) configuration is a matter of growing interest due to the broad possibilities opened in the field of nanomodification , microscopy and spectroscopy of surfaces. In this paper the latest re sults in field enhancement in a laser assisted STM are reviewed.