STRUCTURAL AND ELECTRICAL CHARACTERIZATION OF PROCESSABLE BIS-SILYLATED THIOPHENE OLIGOMERS

Citation
G. Barbarella et al., STRUCTURAL AND ELECTRICAL CHARACTERIZATION OF PROCESSABLE BIS-SILYLATED THIOPHENE OLIGOMERS, Chemistry of materials, 10(11), 1998, pp. 3683-3689
Citations number
39
Categorie Soggetti
Chemistry Physical","Material Science
Journal title
ISSN journal
08974756
Volume
10
Issue
11
Year of publication
1998
Pages
3683 - 3689
Database
ISI
SICI code
0897-4756(1998)10:11<3683:SAECOP>2.0.ZU;2-M
Abstract
A new class of processable, chemically stable, and easily synthesized and purified alpha,omega-bis(dimethyl-tert-butylsilyl) oligothiophenes is described. Information on the solid-state properties was obtained by single crystal X-ray diffraction and CPMAS NMR spectroscopy. Molecu lar packing was characterized by a sandwich-type organization, with th e molecular planes between adjacent layers along the stacking directio n being exactly parallel. Vacuum-evaporated thin films of the tetramer , pentamer, and hexamer displayed field effect transistor activity, wi th charge mobilities increasing with the substrate deposition temperat ures in the range 28-80 degrees C. The best FET performance was achiev ed with the pentamer which was characterized by an on/off ratio > 10(3 ), reproducibility, and a device stability in air of months.