ON-CHIP I-DDQ TESTING IN THE AE11 FAIL-STOP CONTROLLER

Authors
BOHL E LINDENKREUZ T MEERWEIN M
Citation
E. Bohl et al., ON-CHIP I-DDQ TESTING IN THE AE11 FAIL-STOP CONTROLLER, IEEE design & test of computers, 15(4), 1998, pp. 57-65
Citations number
14
Categorie Soggetti
Computer Science Hardware & Architecture","Computer Science Hardware & Architecture
Journal title
IEEE design & test of computers → ACNP
ISSN journal
07407475
Volume
15
Issue
4
Year of publication
1998
Pages
57 - 65
Database
ISI
SICI code
0740-7475(1998)15:4<57:OITITA>2.0.ZU;2-J
Abstract
Targeted for safety-critical applications, this microcontroller replac es the classic two-controller safety structure with a single controlle r containing various online fault detection measures. To minimize chip area without reducing safety, the developers incorporated a combinati on of concurrent checking, BIST, and I-DDQ testing- and considerably e xtended the standard cell-based design flow.