SYSTEM FOR OBTAINING 2-DIMENSIONAL IMAGES OF THE SURFACE-LAYERS OF MATERIALS BY USING COMPTON BACKSCATTERING

This article examines a method of obtaining two-dimensional images of objects formed by scattered x rays. A description is given of a remote ly controlled testing system. The system includes an x-ray tube, a new two-dimensional detector, an electronic control block, and a electron ic block to analyze the resulting signals. A mathematical model, based on a Monte Carlo algorithm devised to calculate detector readings in a geometry close to the actual geometry, is used to perform a theoreti cal analysis of the capabilities of the system. Images obtained on dif ferent test objects are presented, and the advantages offered by the u se of a two-dimensional detector are discussed.