COMMENT ON AN ANALYSIS TECHNIQUE FOR EXTRACTION OF THIN-FILM STRESSESFROM X-RAY DATA [APPL. PHYS. LETT. 71, 2949 (1997)]

Authors
MURRAY CE NOYAN IC
Citation
Ce. Murray et Ic. Noyan, COMMENT ON AN ANALYSIS TECHNIQUE FOR EXTRACTION OF THIN-FILM STRESSESFROM X-RAY DATA [APPL. PHYS. LETT. 71, 2949 (1997)], Applied physics letters, 73(21), 1998, pp. 3165-3166
Citations number
4
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
73
Issue
21
Year of publication
1998
Pages
3165 - 3166
Database
ISI
SICI code
0003-6951(1998)73:21<3165:COAATF>2.0.ZU;2-N