EMF-MEASUREMENTS ON NANOCRYSTALLINE COPPER-DOPED CERIA

Citation
P. Knauth et al., EMF-MEASUREMENTS ON NANOCRYSTALLINE COPPER-DOPED CERIA, Journal of solid state chemistry (Print), 140(2), 1998, pp. 295-299
Citations number
14
Categorie Soggetti
Chemistry Inorganic & Nuclear","Chemistry Physical
ISSN journal
00224596
Volume
140
Issue
2
Year of publication
1998
Pages
295 - 299
Database
ISI
SICI code
0022-4596(1998)140:2<295:EONCC>2.0.ZU;2-A
Abstract
Mixed oxide samples of nanostructured CuxCe1-xO2-y of various composit ion were generated by (i) chemical precipitation and ball milling and (ii) inert gas condensation. X-ray diffraction measurements suggested that copper oxide was dissolved in nanostructured cerium oxide up to c oncentrations of x = 11.15. Solid electrolyte cells of the type A, Cu2 O/CuBr/CuxCe1-xO2-y (A = Cu or CuO) showed reversible cell voltages. T he ratio of the formal chemical activities of CuO and Cu2O dissolved i n nanostructured cerium oxide were calculated from the cell voltages. The results are discussed in terms of an apparent macroscopic solubili ty, due to interfacial segregation of copper oxide on nanostructured c erium oxide. (C) 1998 Academic Press.