XPD INVESTIGATION OF V2O5 TIO2 ANATASE MODEL CATALYSTS/

Citation
H. Poelman et al., XPD INVESTIGATION OF V2O5 TIO2 ANATASE MODEL CATALYSTS/, Surface science, 377(1-3), 1997, pp. 819-823
Citations number
6
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
377
Issue
1-3
Year of publication
1997
Pages
819 - 823
Database
ISI
SICI code
0039-6028(1997)377:1-3<819:XIOVTA>2.0.ZU;2-Q
Abstract
The system V2O5/TiO2 anatase is an important industrial catalyst for t he partial oxidation of hydrocarbons. Model catalysts were prepared by depositing thin V2O5 layers upon clean anatase single crystal mineral s by means of DC magnetron sputtering. XPD measurements were performed on the fresh structure, recording the Ti 2p(3/2), V 2p(3/2) O 1s and C 1s photoemission lines at 28 degrees polar angle. The scans displaye d a marked degree of symmetry and structure, which was interpreted on the basis of the experimental anatase XPD pattern. After a standard ca talytic reaction the used model catalysts were re-examined by a simila r XPD characterization.