The system V2O5/TiO2 anatase is an important industrial catalyst for t
he partial oxidation of hydrocarbons. Model catalysts were prepared by
depositing thin V2O5 layers upon clean anatase single crystal mineral
s by means of DC magnetron sputtering. XPD measurements were performed
on the fresh structure, recording the Ti 2p(3/2), V 2p(3/2) O 1s and
C 1s photoemission lines at 28 degrees polar angle. The scans displaye
d a marked degree of symmetry and structure, which was interpreted on
the basis of the experimental anatase XPD pattern. After a standard ca
talytic reaction the used model catalysts were re-examined by a simila
r XPD characterization.