EPITAXIAL-GROWTH OF AG IN THE HEXAGONAL STRUCTURE

Citation
E. Wetli et al., EPITAXIAL-GROWTH OF AG IN THE HEXAGONAL STRUCTURE, Surface science, 377(1-3), 1997, pp. 876-881
Citations number
13
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
377
Issue
1-3
Year of publication
1997
Pages
876 - 881
Database
ISI
SICI code
0039-6028(1997)377:1-3<876:EOAITH>2.0.ZU;2-7
Abstract
The technique of secondary-electron imaging is applied to investigate the structure of Ag films vapor-deposited onto a (0001) surface of Ag2 Al at room temperature. The observations show that Ag grows in the hex agonal close-packed structure up to a thickness of 6-8 atomic layers, while twinned, face-centered cubic domains develop for thicker films.