Te. Whall et Ehc. Parker, SILICON-GERMANIUM HETEROSTRUCTURES - ADVANCED MATERIALS AND DEVICES FOR SILICON TECHNOLOGY - REVIEW, Journal of materials science. Materials in electronics, 6(5), 1995, pp. 249-264
The continuing massive investment in silicon technology and the unique
physical and chemical properties of the Si-SiO2 system will ensure th
e dominance of silicon in microelectronics well into the 21st century.
This momentum stimulates development of new materia Is which should f
urther enhance the performance of silicon microelectronic circuitry. S
uch materials must, however, be compatible with silicon processing tec
hnologies. Major advances in silicon technology are now in prospect du
e to breakthroughs in molecular beam epitaxy (MBE) growth which have o
ccurred over the last decade and which have enabled silicon to be allo
yed to its nearest neighbours in the periodic table - Ge, C, and Sn. T
he Si/Si1-xGex heteroepitaxial material system in particular is emergi
ng as a strong candidate to form a silicon-based heterojunction techno
logy. The incorporation of thin, strained, (pseudomorphic) layers of S
i1-xGex in silicon allows significant valence band and conduction band
edge misalignments to be realized along with appreciable reductions i
n bandgap energies. Bandgap engineering-such a powerful tool for modif
ying semiconducting properties (and previously the reserve of compound
semiconductors) - thus becomes accessible to the mainstream microelec
tronics material. This review considers the dramatic impact SiGe could
have on future silicon microelectronics.