SILICON-GERMANIUM HETEROSTRUCTURES - ADVANCED MATERIALS AND DEVICES FOR SILICON TECHNOLOGY - REVIEW

Citation
Te. Whall et Ehc. Parker, SILICON-GERMANIUM HETEROSTRUCTURES - ADVANCED MATERIALS AND DEVICES FOR SILICON TECHNOLOGY - REVIEW, Journal of materials science. Materials in electronics, 6(5), 1995, pp. 249-264
Citations number
90
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
ISSN journal
09574522
Volume
6
Issue
5
Year of publication
1995
Pages
249 - 264
Database
ISI
SICI code
0957-4522(1995)6:5<249:SH-AMA>2.0.ZU;2-U
Abstract
The continuing massive investment in silicon technology and the unique physical and chemical properties of the Si-SiO2 system will ensure th e dominance of silicon in microelectronics well into the 21st century. This momentum stimulates development of new materia Is which should f urther enhance the performance of silicon microelectronic circuitry. S uch materials must, however, be compatible with silicon processing tec hnologies. Major advances in silicon technology are now in prospect du e to breakthroughs in molecular beam epitaxy (MBE) growth which have o ccurred over the last decade and which have enabled silicon to be allo yed to its nearest neighbours in the periodic table - Ge, C, and Sn. T he Si/Si1-xGex heteroepitaxial material system in particular is emergi ng as a strong candidate to form a silicon-based heterojunction techno logy. The incorporation of thin, strained, (pseudomorphic) layers of S i1-xGex in silicon allows significant valence band and conduction band edge misalignments to be realized along with appreciable reductions i n bandgap energies. Bandgap engineering-such a powerful tool for modif ying semiconducting properties (and previously the reserve of compound semiconductors) - thus becomes accessible to the mainstream microelec tronics material. This review considers the dramatic impact SiGe could have on future silicon microelectronics.