The influence of antimony as surfactant on the growth mode of indium o
n GaAs(001) has been investigated for deposition at various temperatur
es. Clean surfaces of (2 x 4) reconstruction were prepared in UHV by t
hermal desorption of a protective arsenic cap deposited on top of homo
epitaxially grown MBE layers. Before In deposition, 2 ML Sb were pre-d
eposited on top of the clean GaAs surface of part of the samples. The
In growth mode was then monitored by AES and compared with that occurr
ing during In growth on GaAs without an Sb interlayer. After removal o
f the samples from UHV, SEM investigations show regularly shaped, flat
In islands oriented along the [110] substrate directions. In comparis
on, In islands grown without an Sb interlayer also show a preferential
orientation along the [110] substrate directions, but differ in shape
and size. Low-temperature In deposition (120 K) leads to the formatio
n of a continuous In layer, which tears during warm up to room tempera
ture. An exchange between surfactant material and indium during growth
is found for both low- and room-temperature In deposition. X-ray diff
raction measurements show a strong influence of the Sb surfactant on t
he crystallinity of the In film.