The Si/Al ratio of a commercial HB-25 beta zeolite sample was increase
d by treatment of dealumination and silicon-insertion. Platinum ions w
ere subsequently dispersed onto the starting and the treated samples t
hrough impregnation of aqueous Pt(NH,),(NO,),. Chemical environments o
f dispersed platinum were characterized by temperature-programmed redu
ction (TPR) technique. The obtained TPR traces varied with extents of
dealumination. Nevertheless, three major signals, in reduction tempera
ture regions around - 50, 80 and 480 degrees C were distinguished from
these TPR traces and characterized as reductions of platinum oxides d
ispersed on the external surface of zeolite (pt(e)O), platinum oxides
occluded in channels ((PtOx)-O-o), and Pt-(-O-Si=)(y) complexes coordi
nated to external surface or defects of zeolite, respectively. From th
e variation in the contribution of the 480 degrees C peak in TPR trace
s, a formation of Si-OH silanol function groups on the zeolite surface
during the dealumination treatment and a elimination of these groups
during the silicon-insertion treatment are indicated. (C) 1998 Elsevie
r Science B.V. All rights reserved.