Ys. Tang et al., OPTICAL-PROPERTIES OF SI-SI1-XGEX AND SI-GE NANOSTRUCTURES, Journal of materials science. Materials in electronics, 6(5), 1995, pp. 356-362
This paper reviews the current research status on the optical properti
es of Si-Si1-xGex and Si-Ge nanostructures. Although this is a relativ
ely new field, existing research has already achieved promising result
s in terms of both physics and possible device applications including
the effect of process-induced strain in nanostructures, quantum confin
ement and improved optical efficiency of collective excitation in wire
s with reduced dimension, and especially the huge improvement of optic
al efficiency in quantum dots after nanofabrication. These results pot
entially open a new field of research into both the physics of Si-Si1-
xGex nanostructures and the possible applications of them in cheap Si
based optoelectronic industry.