X-ray photoelectron spectra of 4,4'-bis(4 styryl-styryl) benzene oligo
mer (4PV) films metallized with chromium and aluminum films were used
to investigate the nature of 4PV-metal interfacial reactions. The chan
ges in the core level spectra of carbon, metal, and oxygen indicated t
he formation of a carbide in a chromium covered oligomer and a metal-o
xide carbon and/or carbide in aluminum covered films. Yet no apparent
reaction was observed in the interfacial layer when depositing the oli
gomer film on the chromium layer. These reactions are used as a possib
le explanation for the electrical characteristics of diodes made from
these materials. (C) 1997 American Institute of Physics.