S. Suzuki et al., FABRICATION AND CHARACTERIZATION OF BA1-XKXBIO3 NB-DOPED SRTIO3 ALL-OXIDE-TYPE SCHOTTKY JUNCTIONS/, Journal of applied physics, 81(10), 1997, pp. 6830-6836
A reproducible process for fabricating Ba1-xKxBiO3/Nb-doped SrTiO3 (BK
BO/STNO) all-oxide-type Schottky junctions has been established, and t
he electrical properties of the junctions have been investigated at ro
om temperature. Improving the STNO surface conditions by high-temperat
ure oxygen-annealing made it possible to fabricate junctions with good
rectification properties. The current-voltage characteristics of the
junctions were explained by conventional thermionic emission theory. A
nomalous capacitance-voltage characteristics of the junctions were obs
erved and were analyzed with a model taking into account the electric-
field-dependent permittivity of STNO and the presence of the interfaci
al layer. The potential barrier profile of the BKBO/STNO interface was
calculated and it can be concluded that this model quantitatively exp
lains the capacitance-voltage characteristics. (C) 1997 American Insti
tute of Physics.