The influence of irradiation by cu particles and subsequent isochronal
annealing on n-GaAs doped with silicon, was investigated. Photolumine
scence (PL) studies revealed the formation of an induced radiation cen
ter at 1.486 eV. In addition to the PL investigation we also employed
capacitance-voltage (C-V) measurements and deep level transient spectr
oscopy (DLTS). The C-V measurements indicate a slight reduction in n-t
ype carriers in treated samples and the DLTS spectra showed a number o
f commonly observed deep levels in irradiated samples (not annealed),
which disappear after annealing. Based on the experimental evidence we
propose that the 1.486 eV band is due to a donor-acceptor-pair transi
tion. Alternative mechanisms are also discussed. (C) 1997 American Ins
titute of Physics.