Cl. Chen et al., PLANAR INTEGRATION OF A RESONANT-TUNNELING DIODE WITH PHEMT USING A NOVEL PROTON IMPLANTATION TECHNIQUE, IEEE electron device letters, 19(12), 1998, pp. 478-480
A novel technique of integrating resonant-tunneling diodes (RTD's) wit
h pseudomorphic high-electron-mobility transistors (pHEMT's) is demons
trated. A proton was implanted through the pHEMT layers to convert the
RTD structure underneath to a high-resistivity buffer without degradi
ng the performance of the pHEMT. The cutoff frequency is 16 GHz for a
1.5-mu m-gate-length pHEMT on such an implanted buffer. Substituting t
he conventional deep mesa etch with ion implantation maintains a highl
y planar surface, Such a monolithically integrated RTD/pHEMT oscillato
r is described.