PLANAR INTEGRATION OF A RESONANT-TUNNELING DIODE WITH PHEMT USING A NOVEL PROTON IMPLANTATION TECHNIQUE

Citation
Cl. Chen et al., PLANAR INTEGRATION OF A RESONANT-TUNNELING DIODE WITH PHEMT USING A NOVEL PROTON IMPLANTATION TECHNIQUE, IEEE electron device letters, 19(12), 1998, pp. 478-480
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
07413106
Volume
19
Issue
12
Year of publication
1998
Pages
478 - 480
Database
ISI
SICI code
0741-3106(1998)19:12<478:PIOARD>2.0.ZU;2-5
Abstract
A novel technique of integrating resonant-tunneling diodes (RTD's) wit h pseudomorphic high-electron-mobility transistors (pHEMT's) is demons trated. A proton was implanted through the pHEMT layers to convert the RTD structure underneath to a high-resistivity buffer without degradi ng the performance of the pHEMT. The cutoff frequency is 16 GHz for a 1.5-mu m-gate-length pHEMT on such an implanted buffer. Substituting t he conventional deep mesa etch with ion implantation maintains a highl y planar surface, Such a monolithically integrated RTD/pHEMT oscillato r is described.