STRUCTURAL-PROPERTIES OF ELECTRON-BEAM EVAPORATED CDTE-FILMS

CdTe thin films were deposited on glass substrates using electron beam evaporation technique. The cadmium enriched starting materials, as (1 -x)% Cd and x% Te where x varies from 20% to 45%, were used for fabric ation of thin films. The variation of structural properties wih compos ition of Cd and Te in starting materials have been studied. Films were characterised by using XRD and SEM techniques. In the composition ran ge 20% less than or equal to x less than or equal to 45% CdTe films ar e n-type and polycrystalline. Scanning electron microscopic studies of the films indicate that the grains are fine and with small size of cr ystallites. X-ray diffractograms show that the grain size of CdTe film s varies from 1.33 to 1.57 Angstrom. It has been observed that the cub ic structure of CdTe films is more responsible for their high conducti vity.