The ion charge state distribution in EBIS and EBIT as well as the corr
esponding ion current outputs from this devices are modelled for diffe
rent possible trap operating modes. Thereby, for EBIS and EBIT a model
was developed for the calculation of ion charge state distributions c
onsidering single and double ionization and charge exchange processes,
radiative recombination and strong ion cooling. A detailed descriptio
n of the model is given. A computer code based on the developed model
is able to calculate EBIS and EBIT basic parameters: ion charge state
spectrum, ion temperatures and output ion beam currents. Simulation re
sults are given for nitrogen, neon, argon, krypton and uranium and are
for some cases compared with available experimental data.