T. Asano et al., ION-BEAM MODIFIED PHOTORESIST - A NEW CLASS OF FIELD EMITTER MATERIALFOR LARGE-AREA DEVICES, IEICE transactions on electronics, E81C(11), 1998, pp. 1715-1720
Ion beam irradiation effects on a novolac positive-tone photoresist an
d its application to micron-size field emitters have been investigated
. Irradiation of Ar and P ions was examined. The electrical resistivit
y of the photoresist firm is found to decrease after Ar ion implantati
on at doses on the order of 10(16) cm(-2). Baking of the photoresist p
rior to irradiation at a high temperature is preferred to produce elec
trical conductivity. P ions show weaker effects than Ar ions. Raman sp
ectroscopy shows that carbon-carbon bonds such as the graphite bond ar
e produced due to ion bombardment. The field emission of electrons is
observed from emitters made of the ion-irradiated photoresist. The emi
ssion current is shown to be fairly stable when it is compared with an
emission characteristic of synthesized diamond. Fabrication of field
emitter arrays using a mold technique is demonstrated. The field emitt
er array shows emission at a current level of about 40 mu A.