ION-BEAM MODIFIED PHOTORESIST - A NEW CLASS OF FIELD EMITTER MATERIALFOR LARGE-AREA DEVICES

Citation
T. Asano et al., ION-BEAM MODIFIED PHOTORESIST - A NEW CLASS OF FIELD EMITTER MATERIALFOR LARGE-AREA DEVICES, IEICE transactions on electronics, E81C(11), 1998, pp. 1715-1720
Citations number
13
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
09168524
Volume
E81C
Issue
11
Year of publication
1998
Pages
1715 - 1720
Database
ISI
SICI code
0916-8524(1998)E81C:11<1715:IMP-AN>2.0.ZU;2-F
Abstract
Ion beam irradiation effects on a novolac positive-tone photoresist an d its application to micron-size field emitters have been investigated . Irradiation of Ar and P ions was examined. The electrical resistivit y of the photoresist firm is found to decrease after Ar ion implantati on at doses on the order of 10(16) cm(-2). Baking of the photoresist p rior to irradiation at a high temperature is preferred to produce elec trical conductivity. P ions show weaker effects than Ar ions. Raman sp ectroscopy shows that carbon-carbon bonds such as the graphite bond ar e produced due to ion bombardment. The field emission of electrons is observed from emitters made of the ion-irradiated photoresist. The emi ssion current is shown to be fairly stable when it is compared with an emission characteristic of synthesized diamond. Fabrication of field emitter arrays using a mold technique is demonstrated. The field emitt er array shows emission at a current level of about 40 mu A.