THE EFFECT OF TE ISOELECTRONIC SUBSTITUTION ON THE ELECTRICAL AND OPTICAL-PROPERTIES OF THE GE-S-SE AMORPHOUS-CHALCOGENIDE SYSTEM STUDIED IN THIN-FILMS

Citation
K. Sedeek et al., THE EFFECT OF TE ISOELECTRONIC SUBSTITUTION ON THE ELECTRICAL AND OPTICAL-PROPERTIES OF THE GE-S-SE AMORPHOUS-CHALCOGENIDE SYSTEM STUDIED IN THIN-FILMS, Vacuum, 51(3), 1998, pp. 329-333
Citations number
22
Categorie Soggetti
Physics, Applied","Material Science
Journal title
VacuumACNP
ISSN journal
0042207X
Volume
51
Issue
3
Year of publication
1998
Pages
329 - 333
Database
ISI
SICI code
0042-207X(1998)51:3<329:TEOTIS>2.0.ZU;2-K
Abstract
The results are presented of a study of the electrical and optical pro perties of vacuum evaporated amorphous thin films in the Ge-S-Se syste m. The effect of Te isoelectronic substitution either completely for S to give Ge-2.5 Te-2.5 Se-95 and Ge-5 Te-5 Se-90 or partially for Se t o yield Ge-2.5 S-2.5 Te-2.5 Se-92.5 and Ge-5 S-5 Te-5 Se-85 is discuss ed. The changes recorded for the electrical conductivity, the thermal activation energy and for the red shift of the absorption band edge ar e interpreted in terms of some physical properties such as connectedne ss, electronegativity, bond strength and atomic size. Correlation betw een the Tg and E-04 values for samples with the same average coordinat ion number is also given. (C) 1998 Elsevier Science Ltd. All rights re served.