Mp. Seah et Is. Gilmore, QUANTITATIVE AES - VIII - ANALYSIS OF AUGER-ELECTRON INTENSITIES FROMELEMENTAL DATA IN A DIGITAL AUGER DATABASE, Surface and interface analysis, 26(12), 1998, pp. 908-929
An analysis of the correlation of theoretical predictions for Auger el
ectron intensities is made with the experimental data of the high-reso
lution digital Auger database. This analysis covers single-element sam
ples measured for 5 keV and 10 keV beam energies. The spectral data ar
e for wide scans of 20-2500 eV at 1 eV energy resolution and 1 eV ener
gy intervals, as well as narrow scans at 0.25 eV energy resolution and
0.1 eV energy intervals. All spectra have the instrument intensity/en
ergy response function removed so that peak areas are measured in unit
s of electrons emitted per steradian per incident electron. Correlatio
ns are made for calculations of the intensities using the cross-sectio
n of Casnati et al. applied to the K, L, M and N shells, the backscatt
ering factor of Shimizu and the inelastic mean free paths of Tanuma et
al. The intensities, summed over all peaks relating to initial ioniza
tions in shells of a given principal quantum number, correlate with th
e theoretical predictions with no fitting parameters, with a mean erro
r of a factor of only 1.04 and a scatter factor of 1.3. Expressions ar
e provided to extend the database to other beam energies and angles of
incidence. General equations are also provided to extract new sensiti
vity factors for the average matrix, which lead to matrix factors that
effectively reduce to unity for peaks above 175 eV, instead of the tr
aditional matrix factors that cover a range of 0.1-7.2. These sensitiv
ity factors for the average matrix may be used for peak areas, peak he
ights or differential peak-to-peak intensities. In the latter two case
s, spectral broadening may be necessary to obtain accurate results. (C
) 1998 John Wiley & Sons, Ltd.