X-RAY-DIFFRACTION TOMOGRAPHY USING INTERFERENCE EFFECTS

When the electromagnetic wave excites more than one electron, the cohe rent scatter from different electrons gives rise to interference effec ts. X-rays scattered from a crystalline solid can constructively inter fere, producing a diffracted beam at well-defined Bragg angles. The ai m of this work is to describe a new imaging method based on the detect ion of diffracted X-rays. Diffraction patterns of polycrystalline soli ds (lead, silver and copper) were measured. A selective discrimination of a given element in a scanned specimen can be realized by fixing th e Bragg angle which produces an interference peak and then, to carry o ut the computed tomography in the standard mode. The images obtained s how the feasibility of this selective tomography. (C) 1998 Elsevier Sc ience B.V. All rights reserved.