COMBINATION OF SPECULAR AND OFF-SPECULAR LOW-ANGLE X-RAY-DIFFRACTION IN THE STUDY OF METALLIC MULTILAYERS

Authors
DEBERNABE A CAPITAN MJ FISCHER HE QUIROS C PRIETO C COLINO J MOMPEAN F SANZ JM
Citation
A. Debernabe et al., COMBINATION OF SPECULAR AND OFF-SPECULAR LOW-ANGLE X-RAY-DIFFRACTION IN THE STUDY OF METALLIC MULTILAYERS, Solid state communications, 108(10), 1998, pp. 769-773
Citations number
19
Categorie Soggetti
Physics, Condensed Matter
Journal title
Solid state communications → ACNP
ISSN journal
00381098
Volume
108
Issue
10
Year of publication
1998
Pages
769 - 773
Database
ISI
SICI code
0038-1098(1998)108:10<769:COSAOL>2.0.ZU;2-E
Abstract
The use of resonant low-angle X-ray diffraction, combining specular an d off-specular scans, has been used to characterize accurately and sel f-consistently the mesoscopic structure and the quality of interfaces for a set of magnetron sputtered Co/Cu multilayers. In addition, the u se of a simulation program to fit experimental patterns, which is base d on the Distorted Wave Born Approximation has permitted to confirm it s validity in the region of total external reflection in a system havi ng a high degree of complexity. (C) 1998 Elsevier Science Ltd. All rig hts reserved.