BOOLEAN EQUATIONS FOR MULTIPLE PATHS SENSITIZATION OF DIGITAL OSCILLATION BUILT-IN SELF-TEST

Authors
DUFAZA C IHS H KAMINSKA B
Citation
C. Dufaza et al., BOOLEAN EQUATIONS FOR MULTIPLE PATHS SENSITIZATION OF DIGITAL OSCILLATION BUILT-IN SELF-TEST, Electronics Letters, 34(23), 1998, pp. 2213-2215
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
34
Issue
23
Year of publication
1998
Pages
2213 - 2215
Database
ISI
SICI code
0013-5194(1998)34:23<2213:BEFMPS>2.0.ZU;2-Y
Abstract
A major improvement to the digital oscillation built-in self test (DOB IST) method is proposed. The DOBIST technique deals with simultaneousl y testing path delay, gate delay and stuck-at faults in digital integr ated circuits. The equations reported allow concurrent multiple oscill ations and greatly improve the DOBIST rest quality.