PERSISTENT PHOTOCONDUCTIVITY IN SI DELTA-DOPED GAAS AT LOW DOPING CONCENTRATION

Citation
Cy. Chen et al., PERSISTENT PHOTOCONDUCTIVITY IN SI DELTA-DOPED GAAS AT LOW DOPING CONCENTRATION, Applied physics letters, 73(22), 1998, pp. 3235-3237
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
73
Issue
22
Year of publication
1998
Pages
3235 - 3237
Database
ISI
SICI code
0003-6951(1998)73:22<3235:PPISDG>2.0.ZU;2-0
Abstract
In addition to the persistent photoconductivity (PPC) attributed to DX centers in GaAs delta-doped with Si, a weak PPC (WPPC) with a PPC car rier density independent of Si-doping concentration has been generally reported at ambient atmosphere, but the nature of the deep states res ponsible has not been elucidated. Here, we present the results of a de tailed study of the WPPC in delta-GaAs: Si at low-doping densities, N- Si approximate to 1-3 x 10(12) cm(-2), and ambient pressure. It is con cluded that the WPPC does not arise from DX centers but from another d eep defect, which is DX-like in the sense that it can be metastably ex cited. The presence of two distinct DX-like states is apparent from tw o separate annealing temperatures of the PPC, T-a approximate to 50 K and T-b approximate to 230 K; to the best of our knowledge, the latter is the highest annealing temperature observed in the AlGaAs: Si syste m. (C) 1998 American Institute of Physics. [S0003-6951(98)00148-X].