JUMPING MODE SCANNING FORCE MICROSCOPY

In this letter, we present a new scanning probe microscopy mode, jumpi ng mode, which allows the simultaneous measurement of the topography a nd of some other physical property of the sample. Essentially, at each image point first the topography of the sample is measured during a f eedback phase of a cycle, and then the tip-sample interaction is evalu ated in real time as the tip is moved away and towards the sample. Sin ce the lateral motion is done out of contact the method is free, or ne arly free, of shear forces. The general advantages of jumping mode are discussed. Finally, two different applications of this mode are prese nted. In addition to the topography, the first application measures th e adhesion between the tip and the sample, while the second determines the corresponding electrostatic interaction. (C) 1998 American Instit ute of Physics. [S0003-6951(98)01048-1].