DEPTH PROFILING OF A SINGLE-CRYSTAL OF YBCO SUPERCONDUCTOR USING MICRO-PIXE TECHNIQUE

Elemental depth profiling of a small single crystal (1.5 mm x 1.3 mm x 0.1 mm) of a YBCO superconductor was carried out non-destructively by scanning its thickness with a proton microbeam, and analyzing the cha racteristic Xrays produced (the micro-PIXE technique). Elemental compo sition spectra, two-dimensional elemental distribution maps, and one-d imensional line scan spectra from several parts of the thickness were acquired. The results are discussed in the light of the method used fo r growing the crystal and on the basis of the electronic structure the ory of the high-T-c superconducting compounds. (C) 1997 Elsevier Scien ce B.V.