DEPTH LOCATING OF ELEMENTS BY THE PIXE TECHNIQUE

We propose here a method to estimate whether two kinds of elements of different atomic numbers are at the same depth in a sample. A PIXE exp eriment provides the number of X-rays emitted from these elements when hit by a proton beam at two close lying energies. The variation of th ese numbers versus energy allows one to deduce the desired information on these depths after correcting the effects of atomic numbers. A few examples of applications are presented in order to demonstrate the se nsitivity of this procedure. (C) 1997 Elsevier Science B.V.