AN EFFICIENT TEST-GENERATION FOR MULTIPLE-FAULT COVERAGE OF 2-RAIL CHECKERS

The design and implementation of an efficient test generation method f or multiple fault coverage of self-testing two-rail checkers are prese nted. This method involves two steps. In the first step, the minimum s et of tests required to detect all multiple faults is determined by wo rking backwards from output to input. In the second step, a novel anal ytic scheme is used to analyse the test set, to enable the user to sim plify the implementation of the test generation procedure. The resulta nt test has a test length significantly shorter than those previously reported. The test generation method is also suitable for parity check ers.