The optically induced changes of dissolution rates of AsxS100-x (x = 3
8, 40, 42) amorphous films produced by thermal- or flash-evaporation w
ere measured. The fresh-evaporated (as-evaporated) films dissolved mor
e slowly than films which were exposed or annealed. We suggest that th
e slower dissolution is caused by the poorly soluble 'molecular struct
ures' (As4S4, As-4, S-a, S-8), in the films. The dissolution rates of
these films can be increased, when cetyltrimethylamonium bromide (CTAB
) or other alkyl-or aryl-ammonium compounds are sorbed onto the chalco
genide surface. The Raman spectra revealed that the sorption takes pla
ce on As-rich parts of the film. The interaction of sorbed ions with a
chalcogenide surface is probably of the Coulomb type. (C) 1997 Elsevi
er Science B.V.