STATISTICAL-ANALYSIS OF IN-SITU SLIP LINES BY ATOMIC-FORCE MICROSCOPYOBSERVATIONS

Authors
COUPEAU C GIRARD JC GRILHE J LEPINOUX J
Citation
C. Coupeau et al., STATISTICAL-ANALYSIS OF IN-SITU SLIP LINES BY ATOMIC-FORCE MICROSCOPYOBSERVATIONS, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 76(6), 1997, pp. 1139-1152
Citations number
16
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter","Metallurgy & Metallurigical Engineering
Journal title
Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties → ACNP
ISSN journal
13642804
Volume
76
Issue
6
Year of publication
1997
Pages
1139 - 1152
Database
ISI
SICI code
1364-2804(1997)76:6<1139:SOISLB>2.0.ZU;2-P
Abstract
Atomic force microscopy images have been performed in situ during defo rmation of MC2 Nickel-based alloy phase gamma and LiF single crystals at room temperature. The appearance of slip lines was continuously obs erved. We propose methods to determine the statistic average step heig ht and terrace width of this pattern. For the two crystals, hierarchic al organization of slip lines is deduced.