Processing of experimental reflectivity data within the REFLAN software package

The search for the optimum model of the structure of a layered medium based on experimental reflectivity data is considered. A new modification of the successive-descent method is developed for minimizing the functional descr ibing the discrepancy between the observed and the calculated reflectivity profiles. The significance of the model parameters is established as a resu lt of the test of simple statistical hypotheses. The efficiency of the meth od developed is illustrated on an experimental reflectivity profile measure d earlier by Wiesler and Majkrzhak [2].