Citation
Ov. Konovalov et al., Statistical substantiation of parametrization of a film model in reflectometry, CRYSTALLO R, 44(2), 1999, pp. 319-323
Citations number
13
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CRYSTALLOGRAPHY REPORTS
ISSN journal
10637745
→ ACNP
Volume
44
Issue
2
Year of publication
1999
Pages
319 - 323
Database
ISI
SICI code
1063-7745(199903/04)44:2<319:SSOPOA>2.0.ZU;2-6
Abstract
The determination of the optimum number of model parameters in the restorat
ion of the structure of a layer system from X-ray and neutron reflectivity
data is considered. It is shown that, in order to avoid erroneous conclusio
ns about the significance of the model parameters, one has to estimate the
errors of their determination.