Interhalogen plasma chemistries for the etching of NiMnSb

Citation
H. Cho et al., Interhalogen plasma chemistries for the etching of NiMnSb, EL SOLID ST, 2(2), 1999, pp. 70-71
Citations number
10
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
ELECTROCHEMICAL AND SOLID STATE LETTERS
ISSN journal
10990062 → ACNP
Volume
2
Issue
2
Year of publication
1999
Pages
70 - 71
Database
ISI
SICI code
1099-0062(199902)2:2<70:IPCFTE>2.0.ZU;2-D
Abstract
NiMnSb thin films have been etched in plasma chemistries ICl and IBr, under inductively coupled plasma conditions. These interhalogens produce practic al etch rates (500-1500 Angstrom/min(-1)) provided the incident ion energy is above threshold values (similar to 120 eV for ICl, similar to 230eV for IBr) and there is a balance of etch product formation and desorption throug h control of the ion and reactive neutral fluxes. Both chemistries appear p romising for pattern transfer in NiMnSb- based spin polarized magnetic devi ces. (C) 1999 The Electrochemical Society. S1099- 0062( 98) 09- 032- 4. All rights reserved.