Erosion, redeposition and boronization lifetime in RFX

Citation
L. Tramontin et al., Erosion, redeposition and boronization lifetime in RFX, J NUCL MAT, 269, 1999, pp. 709-713
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
JOURNAL OF NUCLEAR MATERIALS
ISSN journal
00223115 → ACNP
Volume
269
Year of publication
1999
Pages
709 - 713
Database
ISI
SICI code
0022-3115(199903)269:<709:ERABLI>2.0.ZU;2-T
Abstract
In this paper the boronization lifetime in the reversed field pinch experim ent RFX is discussed. It is found that the redeposition of carbon-rich laye rs, which grow during plasma exposure, cover the boron containing layers pr eventing the getter effect through formation of stable boron oxides. Enhanc ed localized erosion on graphite tiles, which constitute the first wall of the experiment, due to magnetic disturbances or held errors is identified a s the source of carbon which codeposits together with hydrogen over the bor onized layers. Samples covered with different boron containing layers have been exposed to the plasma, analyzed by surface techniques and compared. Th e redeposition process is confirmed to be the main cause determining the bo ronization lifetime. (C) 1999 Elsevier Science B.V. All rights reserved.