In this paper the boronization lifetime in the reversed field pinch experim
ent RFX is discussed. It is found that the redeposition of carbon-rich laye
rs, which grow during plasma exposure, cover the boron containing layers pr
eventing the getter effect through formation of stable boron oxides. Enhanc
ed localized erosion on graphite tiles, which constitute the first wall of
the experiment, due to magnetic disturbances or held errors is identified a
s the source of carbon which codeposits together with hydrogen over the bor
onized layers. Samples covered with different boron containing layers have
been exposed to the plasma, analyzed by surface techniques and compared. Th
e redeposition process is confirmed to be the main cause determining the bo
ronization lifetime. (C) 1999 Elsevier Science B.V. All rights reserved.