AFM and x-ray studies on the growth and quality of Nb(110) on alpha-Al2O3(11(2)over-bar-0)

Authors
Wolfing, B Theis-Brohl, K Sutter, C Zabel, H
Citation
B. Wolfing et al., AFM and x-ray studies on the growth and quality of Nb(110) on alpha-Al2O3(11(2)over-bar-0), J PHYS-COND, 11(13), 1999, pp. 2669-2678
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS-CONDENSED MATTER
ISSN journal
09538984 → ACNP
Volume
11
Issue
13
Year of publication
1999
Pages
2669 - 2678
Database
ISI
SICI code
0953-8984(19990405)11:13<2669:AAXSOT>2.0.ZU;2-U
Abstract
We report the effect of annealing of sapphire substrate surfaces and explai n the development of step patterns with large terraces. Furthermore, the ep itaxial growth of Nb(110) on annealed and unannealed sapphire substrates is studied by AFM and x-ray methods. For the explanation of the well known tw o component line shape of transverse x-ray scans across Nb(110) Bragg peaks , a structural model is suggested.