Scanning tunneling microscopy tip shape imaging by "shadowing": Monitoringof in situ tip preparation

Citation
B. Voigtlander et M. Kastner, Scanning tunneling microscopy tip shape imaging by "shadowing": Monitoringof in situ tip preparation, J VAC SCI B, 17(2), 1999, pp. 294-296
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
17
Issue
2
Year of publication
1999
Pages
294 - 296
Database
ISI
SICI code
1071-1023(199903/04)17:2<294:STMTSI>2.0.ZU;2-O
Abstract
The shape:of the scanning tunneling microscope (STM) tip was imaged with na nometer resolution using ''shadow images.'' When a Ge molecular beam is eva porated from the side onto a Si sample while the STM tip is stationary in t unneling position close to the sample,surface, the tip shades part of, the sample surface. Subsequent imaging of this shadow area with the STM results In contrast between areas on the sample where Ge was evaporated, and areas where the Ge flux was impeded by the tip, This method was applied to monit or the tip shape after in situ tip preparation processes, like sputtering a nd heating of the tip. (C) 1999 American Vacuum Society. [S0734-211X(99)012 02-0].