B. Voigtlander et M. Kastner, Scanning tunneling microscopy tip shape imaging by "shadowing": Monitoringof in situ tip preparation, J VAC SCI B, 17(2), 1999, pp. 294-296
The shape:of the scanning tunneling microscope (STM) tip was imaged with na
nometer resolution using ''shadow images.'' When a Ge molecular beam is eva
porated from the side onto a Si sample while the STM tip is stationary in t
unneling position close to the sample,surface, the tip shades part of, the
sample surface. Subsequent imaging of this shadow area with the STM results
In contrast between areas on the sample where Ge was evaporated, and areas
where the Ge flux was impeded by the tip, This method was applied to monit
or the tip shape after in situ tip preparation processes, like sputtering a
nd heating of the tip. (C) 1999 American Vacuum Society. [S0734-211X(99)012
02-0].