Field emission microscopy study of cesium adsorbed on ZrB2, and TiB2

Citation
M. Hansen et Ch. Hinrichs, Field emission microscopy study of cesium adsorbed on ZrB2, and TiB2, J VAC SCI B, 17(2), 1999, pp. 297-302
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
17
Issue
2
Year of publication
1999
Pages
297 - 302
Database
ISI
SICI code
1071-1023(199903/04)17:2<297:FEMSOC>2.0.ZU;2-U
Abstract
Field emission microscopy was used to investigate the thermal desorption of cesium from ZrB2 and TiB2 surfaces. Described is a method of extracting th e work function and effective emitting area from the Fowler-Nordheim data w ith minimum assumptions. Work functions were measured after heating at succ essively higher desorption temperatures, assuming a value of 2.2 eV for the cesium saturated surface. The minimum value of the work function for the c esium coated ZrB2 surface was 2.04+/-0.1 eV, while that of the TiB2 surface was 1.74+/-0.05 eV. Average work functions of the thermally cleaned ZrB2 a nd TiB2 surfaces were found to be 3.78 eV and 5.44 eV, respectively. Activa tion energies for thermal desorption of cesium from ZrB2 and TiB2 were foun d to be 1.1+/-0.1 and 0.71+/-0.2 eV, respectively. (C) 1999 American Vacuum Society. [S0734-211X(99)08902-7].