We have developed a simple lithographic technique for repairing damaged chi
ps, even after the end of the whole fabrication process, by using simply a
light microscope for lithographic definition. In the usual laboratory; prac
tice, it can happen that the fabricated chips present defects which make th
em useless, such as: broken metallic lines, or unwanted contacts between cl
ose elements on the same layer. Repairing these defects requires that the d
amaged area is lithographically defined in the photoresist,;so that a subse
quent step of film deposition (for broken lines) or etching (for unwanted c
ontacts) can be performed. The white illumination of a usual light microsco
pe with a reduced field (by means of a diaphragm already present in the mic
roscope optical path) can provide the necessary light source to expose-the
resist. Both spots and narrow lines (several microns wide)can be defined in
the resist; we give the details of operation and show some examples from o
ur devices. (C) 1999 American Vacuum Society. [S0734-211X(99) 10702-9].