Analysis of a field-emission magnetic sensor with compensated electron-beam deviation

Citation
Mi. Marques et al., Analysis of a field-emission magnetic sensor with compensated electron-beam deviation, J VAC SCI B, 17(2), 1999, pp. 788-791
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
17
Issue
2
Year of publication
1999
Pages
788 - 791
Database
ISI
SICI code
1071-1023(199903/04)17:2<788:AOAFMS>2.0.ZU;2-7
Abstract
A new concept magnetic sensor is proposed and its operation is analyzed usi ng a: numerical model. The sensor comprises an array of integrated electron emitters, each one With the tip at potential V-t, and two deflection elect rodes at potentials + V-d/2 and -V-d/2. The deflection of the beam due to t he Lorentz force can be compensated by a suitable choice of the electric fi eld formed between the electrodes. In this way, a correlation V-d(B) betwee n the electron:deflection compensating voltage Vd and the magnetic-field B to be measured is obtained. A linear relationship! Vd(B) has been outlined, its slope depending on both the tip-anode difference:of potential and the geometrical parameters of the system. (C) 1999 American Vacuum Society. [S0 734-211X(99)10002-7].