Ag. Liu et al., Simulation of dose uniformity for different pulse durations during inner surface plasma immersion ion implantation, J VAC SCI B, 17(2), 1999, pp. 875-878
Without the line-of-sight limitation, plasma immersion ion implantation (PI
LI) emulates conventional beam-line ion implantation in inner surface modif
ication of industrial components. However, dose uniformity on the inner sur
face is critical. Inner surface PIII of a cylindrical bore is modeled using
a two-dimensional fluid model. It is found that the retained dose is not u
niformly distributed on the inner surface and the maximum dose is observed
away from the edge. The exact location of the maximum dose, which varies wi
th the implant pulse duration, is closer to the center when the pulse width
is longer. The maximum relative difference of the retained dose along the
interior also depends on the implant pulse duration. It is smaller for a lo
nger pulse duration after a threshold value has been exceeded. (C) 1999 Ame
rican Vacuum Society. [S0734-211X(99)02202-7].