Correcting for electron contamination at dose maximum in photon beams

Data are presented to allow the photon beam quality specifier being used in the new AAPM TG-51 protocol, %dd(10)(x), to be extracted from depth-dose d ata measured with a 1 mm lead foil either 50 cm or 30 cm from the phantom s urface. %dd(10)(x) is the photon component of the percentage depth dose at 10 cm depth for a 10 X 10 cm(2) field on the surface of a phantom at an SSD of 100 cm. The purpose of the foil is to remove the unknown electron conta mination from the accelerator head. Monte Carlo calculations are done: (a) to show these electrons are reduced to a negligible level; (b) to calculate the amount of electron contamination from the lead foil at the depth of do se maximum; and (c) to calculate the effect of beam hardening on %dd(10). T he analysis extends the earlier work of Li and Rogers [Med. Phys. 21, 791-7 98 (1994)] which only provided data for the foil at 50 cm. An error in the earlier Monte Carlo simulations is reported and a more convenient method of analyzing and using the data is presented. It is shown that 20% variations in the foil thickness have a negligible effect on the calculated correctio ns. [S0094-2405(99)01104-9].