Spatially resolved spectral interferometry for determination of subsurfacestructure

Citation
Af. Zuluaga et R. Richards-kortum, Spatially resolved spectral interferometry for determination of subsurfacestructure, OPTICS LETT, 24(8), 1999, pp. 519-521
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS LETTERS
ISSN journal
01469592 → ACNP
Volume
24
Issue
8
Year of publication
1999
Pages
519 - 521
Database
ISI
SICI code
0146-9592(19990415)24:8<519:SRSIFD>2.0.ZU;2-E
Abstract
We describe an instrument capable of obtaining two-dimensional images of su bsurface structure in real time with no moving parts. The technique is base d on spectral interferometry and uses an imaging spectrograph to obtain spa tially resolved spectra. A test sample consisting of microscope coverslips and a Ronchi grating was measured, illustrating the system's depth resoluti on of 38 mu m and transverse resolution of at least 12.7 mu m. The techniqu e is readily adaptable to endoscopic delivery as well as three-dimensional real-time image acquisition. (C) 1999 Optical Society of America.