Pa. Fomitchov et S. Krishnaswamy, A COMPACT DUAL-PURPOSE CAMERA FOR SHEAROGRAPHY AND ELECTRONIC SPECKLE-PATTERN INTERFEROMETRY, Measurement science & technology, 8(5), 1997, pp. 581-583
A dual-purpose camera for both shearography and electronic speckle-pat
tern interferometry (ESPI) based on the concept of additive-subtractiv
e phase-modulated speckle interferometry has been designed and tested.
The compact camera can be operated either in ESPI mode or in shearogr
aphy mode by simply adjusting a moving mirror in the camera head. This
camera has been designed as an optical part of an automatic inspectio
n system for disbond detection in aircraft structures. The primary adv
antage is the possibility of obtaining information both about an objec
t's displacement and about its gradient using a single low-cost device
suitable for field applications.