A COMPACT DUAL-PURPOSE CAMERA FOR SHEAROGRAPHY AND ELECTRONIC SPECKLE-PATTERN INTERFEROMETRY

Citation
Pa. Fomitchov et S. Krishnaswamy, A COMPACT DUAL-PURPOSE CAMERA FOR SHEAROGRAPHY AND ELECTRONIC SPECKLE-PATTERN INTERFEROMETRY, Measurement science & technology, 8(5), 1997, pp. 581-583
Citations number
8
Categorie Soggetti
Instument & Instrumentation",Engineering
ISSN journal
09570233
Volume
8
Issue
5
Year of publication
1997
Pages
581 - 583
Database
ISI
SICI code
0957-0233(1997)8:5<581:ACDCFS>2.0.ZU;2-V
Abstract
A dual-purpose camera for both shearography and electronic speckle-pat tern interferometry (ESPI) based on the concept of additive-subtractiv e phase-modulated speckle interferometry has been designed and tested. The compact camera can be operated either in ESPI mode or in shearogr aphy mode by simply adjusting a moving mirror in the camera head. This camera has been designed as an optical part of an automatic inspectio n system for disbond detection in aircraft structures. The primary adv antage is the possibility of obtaining information both about an objec t's displacement and about its gradient using a single low-cost device suitable for field applications.