Quantification of Pt bound to DNA using total-reflection X-ray fluorescence (TXRF)

Citation
Rf. Ruiz et al., Quantification of Pt bound to DNA using total-reflection X-ray fluorescence (TXRF), ANALYST, 124(4), 1999, pp. 583-585
Citations number
14
Categorie Soggetti
Chemistry & Analysis","Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ANALYST
ISSN journal
00032654 → ACNP
Volume
124
Issue
4
Year of publication
1999
Pages
583 - 585
Database
ISI
SICI code
0003-2654(199904)124:4<583:QOPBTD>2.0.ZU;2-0
Abstract
Total-reflection X-ray fluorescence (TXRF), has been applied to a study of DNA platination kinetics of calf thymus in vitro, investigating the interca lation sequences of three Pt-containing medicines (cis-diamminedichloroplat inum(II) (cis-DDP), Pt-Berenil, and K2PtCl4) in DNA. The in vivo study was focused on the introduction process of the cis-DDP and the Pt-Berenil in He La cells. To quantify the amount of Pt bound to the DNA, TXRF needs a sampl e volume less than or equal to 1100 mu l. Pt concentrations from 3 to 30 ng ml(-1) were determined with a relative standard deviation between 2 and 8% . TXRF is shown as an alternative analytical technique for studying metal t races in a biochemical process.