XPS characterization of Bi and Mn collected on atom-trapping silica for AAS

Citation
S. Suzer et al., XPS characterization of Bi and Mn collected on atom-trapping silica for AAS, APPL SPECTR, 53(4), 1999, pp. 479-482
Citations number
16
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
APPLIED SPECTROSCOPY
ISSN journal
00037028 → ACNP
Volume
53
Issue
4
Year of publication
1999
Pages
479 - 482
Database
ISI
SICI code
0003-7028(199904)53:4<479:XCOBAM>2.0.ZU;2-K
Abstract
The chemical state of analyte species collected on a water-cooled silica tu be during atom-trapping atomic absorption spectrometric determination is in vestigated with the use of X-ray photoelectron spectroscopy (XPS) for Bi an d Mn. Analysis of the Bi 4f(7/2) peak reveals that the chemical state of Bi is +3 during initial trapping (before the atomization stage), but an addit ional 0-valence state of Bi is also observed after the atomization stage. W ith the use of the measured Mn 2p(3/2) binding energy together with the obs erved 3s multiplet splitting, the chemical state of Mn is determined as +2 in all stages. Together with our previous determination of 0 valence for Au , it is now postulated that the stability of certain valence states of the three elements (Au, Bi, and Mn) on the silica matrix can be correlated to t heir electrochemical reduction potentials.