Lifetime and stability of diamond field emission devices

Citation
Rl. Fink et al., Lifetime and stability of diamond field emission devices, DIAM FILM T, 8(6), 1998, pp. 435-440
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
DIAMOND FILMS AND TECHNOLOGY
ISSN journal
09174540 → ACNP
Volume
8
Issue
6
Year of publication
1998
Pages
435 - 440
Database
ISI
SICI code
0917-4540(1998)8:6<435:LASODF>2.0.ZU;2-X
Abstract
We present here the results of tests that measure the lifetime of carbon co ld cathodes and determine what conditions limit the lift: of the cathode. C athodes were tested in vacuum chambers using different gas environments as well as in sealed and fettered glass envelopes. We measured a projected emi ssion current half-life of 6,900 h under a constant voltage and expect this to improve to 10,000 h or more. The presence of oxygen decreased the life of the cathode by a factor of five, while the presence of water decreased t he life of the cathode by a factor of 20 or, more. After removing the gases , the decay rare was restored to near the original value. The presence of h ydrogen gas has little or no effect on the life of the cathode.