Evaluation of heterogeneity in thickness of passive films on pure iron by scanning electrochemical microscopy

Citation
K. Fushimi et al., Evaluation of heterogeneity in thickness of passive films on pure iron by scanning electrochemical microscopy, ISIJ INT, 39(4), 1999, pp. 346-351
Citations number
36
Categorie Soggetti
Metallurgy
Journal title
ISIJ INTERNATIONAL
ISSN journal
09151559 → ACNP
Volume
39
Issue
4
Year of publication
1999
Pages
346 - 351
Database
ISI
SICI code
0915-1559(1999)39:4<346:EOHITO>2.0.ZU;2-W
Abstract
Scanning electrochemical microscopy (SECM) was applied to evaluate the hete rogeneity of a passive film formed on a pure iron electrode in deaerated pH 8.4 berate solution. A probe current image of SECM was measured with a tip -generation/substrate-collection (TG/SC) mode in deaerated pH 8.4 berate so lution containing 0.03 mol dm(-3) Fe(CN)(6)(4-) as a mediator. The differen ce in thickness of passive films formed on two iron plates at different pot entials could be evaluated from the probe current image. The probe current image of the passivated iron surface with distinctive crystal grains was co mposed of the patch patterns, the shapes of which coincided completely with the shapes of the substrate crystal grains. The probe current flowed above the grain surface oriented to {100} plane was less than that above the gra in surface oriented to {110} or {111} plane. The grain orientation dependen ce of probe current was ascribed to the difference in thickness of passive films formed on the crystal grains.