Laser-frequency mixing in a scanning tunneling microscope at 1.3 mu m

Citation
T. Gutjahr-loser et al., Laser-frequency mixing in a scanning tunneling microscope at 1.3 mu m, J APPL PHYS, 85(9), 1999, pp. 6331-6336
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
9
Year of publication
1999
Pages
6331 - 6336
Database
ISI
SICI code
0021-8979(19990501)85:9<6331:LMIAST>2.0.ZU;2-9
Abstract
The radiation of two single-mode diode lasers at 1.3 mu m is focused into t he tunneling junction of a scanning tunneling microscope, and gigahertz dif ference-frequency signals radiated from the tip are detected. Simultaneous measurements of the bias-voltage dependence of the mixing signal and the tu nneling current for different surface samples show that the mixing process is due to the nonlinearity of the static current-voltage characteristic of the tunneling junction. The coupling of the laser radiation into the juncti on conforms to antenna theory. The experimental results are compared with p revious measurements at a laser wavelength of 9.3 mu m. Surface images prod uced by means of the difference-frequency signal show the chemical contrast between micron-sized Au islands and a graphite substrate. (C) 1999 America n Institute of Physics. [S0021-8979(99)08109-8].